Tradeshow
SEMICON West 2026
Thank you for joining us at SemiCon West
At SEMICON West 2026, Computar showcased an award-winning lineup of machine vision lenses for semiconductor inspection and other precision imaging applications with four live demonstrations.
Optical Solutions for Semiconductor Inspection & Laser Processing
Featured Product Demonstrations:
- Objective Lens Series
- LensConnect SWIR
- LensConnect Telecentric (TEC-ML)
- Large Format Telecentric (TEC-F)
DEMO 1 | NIR IMAGING & LASER PROCESSING
Objective Lens Series
Demonstration Overview
In this demonstration NIR-compatible objective lenses paired with a SWIR camera. High-resolution NIR imaging makes the setup ideal for silicon wafer inspection, and it can also serve as the observation optics in femtosecond and NIR laser processing systems.
Key Features
- Designed for femtosecond and near-infrared laser processing
- Infinity-corrected optics: half mirrors, filters and other components fit easily between the objective and tube lens
- 5mm parfocal distance: focus stays nearly unchanged when switching magnification
- High-resolution design
- Corrected for 0.7 mm glass: ideal for bright-field observation through LCD glass and for laser processing
Customization Available
WD, magnification, NA and spherical aberration correction. We also support design of the complete optical system.
DEMO 2 | SEE THROUGH WAFER INSPECTION
LensConnect SWIR - Computar ViSWIR HyperAPO Lenses & IMX992
Demonstration Overview
In this demonstration LensConnect SWIR lenses paired with a SWIR camera. Covering 400-1700 nm, the system sees through a silicon wafer to inspect the opposite surface.
Zoom, focus and iris are controlled from dedicated software, moving from a wide view of the whole wafer to a close-up of a single die without changing lenses.
Key Features
- Remote-control lens for visible to SWIR (400-1700 nm)
- Motorized zoom, focus and iris via USB or I²C, with built-in stepping motors for precise adjustment
- Zoom: change the field of view without changing working distance
- Focus: remotely compensate for different object heights and for focus shift between wavelengths
- Iris: adjust the aperture to optimize depth of field
- Two models cover 5.5-35 mm focal length, C-mount
Download LensConnect SWIR Series Specs
DEMO 3 | ELECTRONIC COMPONENT INSPECTION
LensConnect Telecentric Lenses (TEC-ML Series)
Demonstration Overview
Here we demonstrate a motorized-focus telecentric lens for magnified inspection of small parts such as electronic components. Using presets in the control software, the demo switched focus between inspection points at different heights on a PCB.
LensConnect can eliminate the Z-stage, enabling more compact systems and lower total cost.
Key Features
- Industry-first focus-driven telecentric lens
- Remote focus control: operate from a compatible camera via I²C, or choose a USB interface
- Telecentricity is maintained while adjusting focus
- Supports 2/3" 8MP sensors (2.74 µm pixels), C-mount; custom magnifications available
Download LensConnect Telecentric Specs | Request a demo loan unit
DEMO 4 | WAFER DEFECT DETECTION
Large Format Telecentric Lens (TEC-F Series)
Demonstration Overview
Here we demonstrate Telecentric lenses for large 1.1" and 1.2" formats. Paired with a high-resolution camera, they magnify fine structures on silicon wafers for detailed inspection, making them ideal for precise defect detection.
Key Features
- Supports large high-resolution sensors: 1.1" (12.3MP) and 1.2" (24.5MP)
- Uniform high resolution from center to edge
- Wide magnification lineup; all 1.2" models share a 110 mm WD
- Straight and coaxial-illumination types to suit each application
- Variable aperture to control depth of field; C-mount
